François Couny is involved in driving to market innovative optical solutions that help customers overcome challenges to test better and smarter. With EXFO since 2015, he has developed state-of-the-art equipment for spectral optical testing of both active and passive optical components. François holds a PhD in photonics from the University of Bath (UK) and joined Yenista Optics (now EXFO) in 2010 with a focus on developing tunable laser sources and spectral solutions, including an optical spectrum analyzer and an optical component tester adapted to photonic integrated circuit characterization.
Photonic integrated circuit (PIC) design and fabrication have now gained “ready-for-production” status, and the only obstacle to unleashing their true potential lies with efficient testing. As a leading developer of T&M equipment, EXFO has long been committed to providing superior tools for spectral characterization of photonic integrated circuits designed for the telecom wavelength range. This presentation will cover the challenges of testing these components directly on the wafer, EXFO’s range of spectral test solutions—which provide both fast and reliable results—and ways to future proof PIC testing solutions.