During the alignment, calibration, and validation of wavelength selective switches (WSS) based on LCOS or MEMS expanded beam optics, thousands of wavelengths resolved IL/RL/PDL are made in 500ms or less and at picometer or even sub- picometer resolutions per WSS. Scaling costs and volume has been critical to these technologies’ success and wide deployment. Much of what was learned can be directly mapped to PIC testing, however some updates are required to measure additional PIC specific parameters such as TE/TM performance. This session will provide insights into adapting and optimizing existing test processes for WSS to suit the specific requirements of testing PICs.
Matthew Adams is a Senior Product Manager at VIAVI Solutions and has been with company for over 25 years. He has held leadership positions spanning R&D, technology planning, and product management. He is currently focused on developing measurement solutions supporting the design and manufacture of next generation fiber optic communication components, modules, and sub-systems. He is an active contributor to international standards, coauthored several articles and has several patents in the area. Matthew has a master’s degree in engineering physics from McMaster University in Ontario Canada.