PRESENTATION

Edge coupled electro-optical PIC testing on wafer level

Since the introduction of the first electro-optical wafer level tester from ficonTEC in 2019 the system has been constantly improved with respect to additional hardware options as well as process features. As a result, ficonTEC is proud to offer one of the most innovative and technically outstanding photonic test systems, allowing e.g. an optical edge coupling option on wafer level. These capabilities are based on constant joined development projects with strategic partners like Vanguard Photonics for customized optical probing systems, the Politechnico in Milano and Quantify Photonic for sophisticated measurement hardware but also from industrial feedback on machine performance from key customers like VLC.

Moritz Seyfried

ficonTEC

Moritz holds a Master’s degree from Heriot-Watt University in Edinburgh, UK, a diploma degree from the Karlsruhe Institute of Technology (KIT), Germany, as well as a Ph.D. from Bremen University, Germany, all in the field of semiconductor optics. He has spent most of the last twelve years working in the field of organic and inorganic semiconductor optics, ranging from basic research of light-matter interaction phenomenon to photonics product assembly. Moritz joined ficonTEC Service in 2012 and since 2014 is the Manager of the ficonTEC R&D center, located within ficonTEC HQ in Achim, Germany.