PRESENTATION

Serving Reliable and Robust Test and Measurement Needs

Efforts are ongoing to achieve monolithic integration of various III-V epitaxial structures on a heterogeneous integrated silicon photonic platform for foundry manufacturing and its advanced packaging technology. However, high-speed electro-optic design characterization of photonic integrated circuits poses several unique challenges in measurement uncertainty, test time, and data processing, especially with today’s consideration of the shift from development to production. This talk will discuss Keysight's reliable and robust test and measurement solutions that address seamless workflow of IC design to validation collaborated with industry partners.