Photonic integrated circuit (PIC) design and fabrication have now gained “ready-for-production” status, and the only obstacle to unleashing their true potential lies with efficient testing. As a leading developer of T&M equipment, EXFO has long been committed to providing superior tools for spectral characterization of photonic integrated circuits designed for the telecom wavelength range. This presentation will cover the challenges of testing these components directly on the wafer, EXFO’s range of spectral test solutions—which provide both fast and reliable results—and ways to future proof PIC testing solutions.
François Couny was appointed Product Line Manager for EXFO Optics in 2015. He started his career in 2001 as a test and measurement engineer at Blaze Photonics, a start-up company specialized in photonic crystal fiber. He went on to join Yenista Optics in 2010 with a focus on developing tunable laser sources and spectral solutions, including an optical spectrum analyzer and an optical component tester adapted to photonic integrated circuit characterization. Over the years, through listening to PIC users, he has helped develop state-of-the-art equipment for spectral PIC testing. EXFO is an active member of AIM Photonics, and as an integral part of the Optics team, Francois collaborates with multiple actors in the PIC community and plays a pivotal role in enabling tailor-made optical solutions for testing PICs directly on the wafer. François holds a PhD in photonics from the Centre for Photonics and Photonic Material at the University of Bath (UK).