Design, modeling and simulation for the imperfections of real life

As PIC technology matures, it is essential to accurately simulate imperfect components, circuits and systems to account for the vagaries of volume manufacturing. We show how to increase yields by designing robust - yet high performance - components using inverse design methods. We also show state of the art photonic circuit and system design flows that enable statistical analysis to rapidly identify and solve the root issues impacting manufacturing yield. We show how these methods can be applied in PIC applications from datacoms and sensing to quantum information technologies.